000108874 000__ 00925pam\a2200313Wi\4500 000108874 001__ 108874 000108874 005__ 20210513040715.0 000108874 008__ 800618s1980\\\\njua\\\\\\\\\\00110\eng\\ 000108874 010__ $$a80-018615 000108874 020__ $$a0810409534 000108874 035__ $$a(OCoLC)ocm06487436 000108874 035__ $$a00307227 000108874 035__ $$9AAM1877SI 000108874 035__ $$a108874 000108874 040__ $$aDLC$$cDLC$$dm.c.$$dISE 000108874 049__ $$aISEA 000108874 0500_ $$aTK7868.L6$$bK54 000108874 082__ $$a621.3819/5835 000108874 099__ $$aTK7868.L6 K54 000108874 1001_ $$aKneen, John. 000108874 24510 $$aLogic analyzers for microprocessors /$$cJohn Kneen ; edited by Charles H. House. 000108874 260__ $$aRochelle Park, N.J. :$$bHayden Book Co.,$$cc1980. 000108874 300__ $$a110 p. :$$bill. ;$$c23 cm. 000108874 500__ $$aIncludes index. 000108874 650_0 $$aLogic circuits. 000108874 650_0 $$aAutomatic test equipment. 000108874 650_0 $$aMicroprocessors$$xTesting. 000108874 7001_ $$aHouse, Charles H. 000108874 85200 $$bgen$$hTK7868.L6 K54 000108874 909CO $$ooai:library.usi.edu:108874$$pGLOBAL_SET 000108874 966__ $$c 1$$lUSIGEN$$mBKGEN$$sTK7868.L6 K54$$xISEA$$z050$$b39203008974706 000108874 980__ $$aBIB 000108874 980__ $$aBOOK