TY  - GEN
T1  - Accelerated life testing of one-shot devices :data collection and analysis /
AU  - Balakrishnan, N.,
AU  - Ling, Man Ho,
AU  - So, Hon Yiu,
ET  - First edition.
CN  - TA169.3
ID  - 1360569
KW  - Accelerated life testing.
KW  - Failure analysis (Engineering)
SN  - 9781119664031
SN  - 1119664039
SN  - 9781119663942
SN  - 1119663946
SN  - 9781119664017
SN  - 1119664012
TI  - Accelerated life testing of one-shot devices :data collection and analysis /
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6478259
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6478259
ER  -