001360569 000__ 03005nam\a2200553\i\4500 001360569 001__ 1360569 001360569 003__ DLC 001360569 005__ 20210804003149.0 001360569 006__ m\\\\\o\\d\\\\\\\\ 001360569 007__ cr\un\nnnunnun 001360569 008__ 200914t20212021njua\\\\ob\\\\001\0\eng\d 001360569 010__ $$a 2020035726 001360569 020__ $$a9781119664031$$q(electronic book) 001360569 020__ $$a1119664039$$q(electronic book) 001360569 020__ $$a9781119663942$$q(electronic book) 001360569 020__ $$a1119663946$$q(electronic book) 001360569 020__ $$a9781119664017$$q(electronic book) 001360569 020__ $$a1119664012$$q(electronic book) 001360569 020__ $$z9781119664000 001360569 040__ $$aNhCcYBP$$cNhCcYBP 001360569 042__ $$apcc 001360569 050_4 $$aTA169.3$$b.B35 2021 001360569 08200 $$a620/.00452$$223 001360569 1001_ $$aBalakrishnan, N.,$$d1956-$$eauthor. 001360569 24510 $$aAccelerated life testing of one-shot devices :$$bdata collection and analysis /$$cNarayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, the Education University of Hong Kong, Tai Po, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada. 001360569 250__ $$aFirst edition. 001360569 264_1 $$aHoboken, NJ, USA :$$bWiley,$$c2021. 001360569 264_4 $$c©2021 001360569 300__ $$a1 online resource (xiii, 223 pages) :$$billustrations 001360569 336__ $$atext$$btxt$$2rdacontent 001360569 337__ $$acomputer$$bc$$2rdamedia 001360569 338__ $$aonline resource$$bcr$$2rdacarrier 001360569 504__ $$aIncludes bibliographical references and indexes. 001360569 5050_ $$aFront Matter -- One-Shot Device Testing Data -- Likelihood Inference -- Bayesian Inference -- Model Mis-Specification Analysis and Model Selection -- Robust Inference -- Semi-Parametric Models and Inference -- Optimal Design of Tests -- Design of Simple Step-Stress Accelerated Life-Tests -- Competing-Risks Models -- One-Shot Devices with Dependent Components -- Conclusions and Future Directions -- Derivation of Hi(a, b) -- Observed Information Matrix -- Non-Identifiable Parameters for SSALTs Under Weibull Distribution -- Optimal Design Under Weibull Distributions with Fixed w1 -- Conditional Expectations for Competing Risks Model Under Exponential Distribution -- Kendall's Tau for Frank Copula. 001360569 506__ $$aAccess limited to authorized users 001360569 533__ $$aElectronic reproduction.$$bAnn Arbor, MI$$nAvailable via World Wide Web. 001360569 588__ $$aDescription based on online resource; title from digital title page (viewed on July 30, 2021). 001360569 650_0 $$aAccelerated life testing. 001360569 650_0 $$aFailure analysis (Engineering) 001360569 655_0 $$aElectronic books 001360569 7001_ $$aLing, Man Ho,$$eauthor. 001360569 7001_ $$aSo, Hon Yiu,$$eauthor. 001360569 7102_ $$aProQuest (Firm) 001360569 77608 $$iPrint version:$$aBalakrishnan, N., 1956-$$tAccelerated life testing of one-shot devices.$$bFirst edition.$$dHoboken, NJ, USA : Wiley, 2021$$z9781119664000$$w(DLC) 2020035725 001360569 852__ $$bebk 001360569 85640 $$3GOBI DDA$$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6478259$$zOnline Access 001360569 909CO $$ooai:library.usi.edu:1360569$$pGLOBAL_SET 001360569 980__ $$aBIB 001360569 980__ $$aEBOOK 001360569 982__ $$aEbook 001360569 983__ $$aOnline