TY  - GEN
T1  - On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /
AU  - Rumiantsev, Andrej,
CN  - TK7871.85
ID  - 1370772
KW  - Semiconductors
SN  - 9788770221115 (e-book)
TI  - On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5829253
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5829253
ER  -