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001370772 020__ $$z9788770221122
001370772 020__ $$a9788770221115 (e-book)
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001370772 050_4 $$aTK7871.85$$b.R865 2019
001370772 0820_ $$a621.38152$$223
001370772 1001_ $$aRumiantsev, Andrej,$$eauthor.
001370772 24510 $$aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /$$cAndrej Rumiantsev.
001370772 264_1 $$aGistrup, Denmark ;$$aDelft, Netherlands :$$bRiver Publishers,$$c[2019]
001370772 264_4 $$c©2019
001370772 300__ $$a1 online resource (278 pages).
001370772 336__ $$atext$$btxt$$2rdacontent
001370772 337__ $$acomputer$$bc$$2rdamedia
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001370772 4901_ $$aRiver publishers series in electronic materials and devices
001370772 506__ $$aAccess limited to authorized users.
001370772 588__ $$aDescription based on print version record.
001370772 650_0 $$aSemiconductors$$xCharacterization.
001370772 655_0 $$aElectronic books
001370772 77608 $$iPrint version:$$aRumiantsev, Andrej.$$tOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond.$$dGistrup, Denmark ; Delft, Netherlands : River Publishers, c2019 $$z9788770221122
001370772 830_0 $$aRiver Publishers series in electronic materials and devices.
001370772 852__ $$bebk
001370772 85640 $$3ProQuest Ebook Central Academic Complete $$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5829253$$zOnline Access
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001370772 982__ $$aEbook
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