TY  - GEN
T1  - MOS interface physics, process and characterization /
AU  - Wang, Shengkai,
AU  - Wang, Xiaolei,
ET  - First edition.
CN  - TK7871.99.M44
ID  - 1388852
KW  - Metal oxide semiconductors
KW  - Semiconductors
KW  - Integrated circuits
KW  - Solid state physics
SN  - 9781000455762
SN  - 1000455769
SN  - 9781003216285
SN  - 1003216285
SN  - 9781000455748
SN  - 1000455742
TI  - MOS interface physics, process and characterization /
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6702798
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6702798
ER  -