001388852 000__ 02125nam\a2200553\i\4500
001388852 001__ 1388852
001388852 003__ DLC
001388852 005__ 20220223003052.0
001388852 006__ m\\\\\o\\d\\\\\\\\
001388852 007__ cr\un\nnnunnun
001388852 008__ 210413s2022\\\\flu\\\\\ob\\\\000\0\eng\d
001388852 010__ $$a  2021017024
001388852 020__ $$a9781000455762$$q(electronic book)
001388852 020__ $$a1000455769
001388852 020__ $$a9781003216285$$q(electronic book)
001388852 020__ $$a1003216285
001388852 020__ $$z9781032106274$$q(hbk)
001388852 020__ $$z9781032106281$$q(pbk)
001388852 020__ $$a9781000455748$$q(electronic book)
001388852 020__ $$a1000455742$$q(electronic book)
001388852 040__ $$aNhCcYBP$$cNhCcYBP
001388852 042__ $$apcc
001388852 050_4 $$aTK7871.99.M44$$bW35 2022
001388852 08200 $$a621.3815/284$$223
001388852 1001_ $$aWang, Shengkai,$$d1984-$$eauthor.
001388852 24510 $$aMOS interface physics, process and characterization /$$cShengkai Wang, Xiaolei Wang.
001388852 250__ $$aFirst edition.
001388852 264_1 $$aBoca Raton :$$bCRC Press,$$c2022.
001388852 300__ $$a1 online resource.
001388852 336__ $$atext$$btxt$$2rdacontent
001388852 337__ $$acomputer$$bc$$2rdamedia
001388852 338__ $$aonline resource$$bcr$$2rdacarrier
001388852 504__ $$aIncludes bibliographical references.
001388852 506__ $$aAccess limited to authorized users
001388852 533__ $$aElectronic reproduction.$$bAnn Arbor, MI$$nAvailable via World Wide Web.
001388852 588__ $$aDescription based on print version record and CIP data provided by publisher.
001388852 650_0 $$aMetal oxide semiconductors$$xDesign and construction$$xMathematics.
001388852 650_0 $$aSemiconductors$$xJunctions.
001388852 650_0 $$aIntegrated circuits$$xResearch.
001388852 650_0 $$aSolid state physics$$xExperiments.
001388852 655_0 $$aElectronic books
001388852 7001_ $$aWang, Xiaolei,$$d1985-$$eauthor.
001388852 7102_ $$aProQuest (Firm)
001388852 77608 $$iPrint version:$$aWang, Shengkai, 1984-$$tMOS interface physics, process and characterization$$bFirst edition.$$dBoca Raton : CRC Press, 2022$$z9781032106274$$w(DLC)  2021017023
001388852 852__ $$bebk
001388852 85640 $$3GOBI DDA$$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6702798$$zOnline Access
001388852 909CO $$ooai:library.usi.edu:1388852$$pGLOBAL_SET
001388852 980__ $$aBIB
001388852 980__ $$aEBOOK
001388852 982__ $$aEbook
001388852 983__ $$aOnline