MOS interface physics, process and characterization / Shengkai Wang, Xiaolei Wang.
2022
TK7871.99.M44 W35 2022
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Details
Title
MOS interface physics, process and characterization / Shengkai Wang, Xiaolei Wang.
Edition
First edition.
ISBN
9781000455762 (electronic book)
1000455769
9781003216285 (electronic book)
1003216285
9781032106274 (hbk)
9781032106281 (pbk)
9781000455748 (electronic book)
1000455742 (electronic book)
1000455769
9781003216285 (electronic book)
1003216285
9781032106274 (hbk)
9781032106281 (pbk)
9781000455748 (electronic book)
1000455742 (electronic book)
Published
Boca Raton : CRC Press, 2022.
Language
English
Description
1 online resource.
Call Number
TK7871.99.M44 W35 2022
Dewey Decimal Classification
621.3815/284
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users
Reproduction
Electronic reproduction. Ann Arbor, MI Available via World Wide Web.
Source of Description
Description based on print version record and CIP data provided by publisher.
Added Author
Wang, Xiaolei, 1985- author.
Added Corporate Author
ProQuest (Firm)
Available in Other Form
MOS interface physics, process and characterization
Linked Resources
Online Access
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