Development and characterization of a dispersion-encoded method for low-coherence interferometry [electronic resource] / Christopher Taudt.
2022
QC411
Formats
| Format | |
|---|---|
| BibTeX | |
| MARCXML | |
| TextMARC | |
| MARC | |
| DublinCore | |
| EndNote | |
| NLM | |
| RefWorks | |
| RIS |
Cite
Citation
Linked e-resources
Linked Resource
Concurrent users
Unlimited
Authorized users
Open access
Document Delivery Supplied
Open access
Details
Title
Development and characterization of a dispersion-encoded method for low-coherence interferometry [electronic resource] / Christopher Taudt.
Author
ISBN
9783658359263 (electronic bk.)
3658359269 (electronic bk.)
3658359250
9783658359256
3658359269 (electronic bk.)
3658359250
9783658359256
Published
Wiesbaden, Germany : Springer Vieweg, [2022]
Language
English
Description
1 online resource
Item Number
10.1007/978-3-658-35926-3 doi
Call Number
QC411
Dewey Decimal Classification
535/.470287
Summary
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 aem with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Open access.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed December 6, 2021).
Available in Other Form
Linked Resources
Record Appears in
Table of Contents
1 Introduction and motivation
2 Related works and basic considerations
3 Surface profilometry
4 Polymer characterization
5 Thin-film characterization
6 Conclusion.
2 Related works and basic considerations
3 Surface profilometry
4 Polymer characterization
5 Thin-film characterization
6 Conclusion.