TY - GEN N2 - This book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It includes original research presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2019), organized by the Department of ECE, Raghu Institute of Technology, Andhra Pradesh, India. Written by scientists, research scholars and practitioners from leading universities, engineering colleges and R & D institutes around the globe, the papers share the latest breakthroughs in and promising solutions to the most important issues facing todays society. AB - This book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It includes original research presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2019), organized by the Department of ECE, Raghu Institute of Technology, Andhra Pradesh, India. Written by scientists, research scholars and practitioners from leading universities, engineering colleges and R & D institutes around the globe, the papers share the latest breakthroughs in and promising solutions to the most important issues facing todays society. T1 - Microelectronics, Electromagnetics and Telecommunications :proceedings of the fifth ICMEET 2019 / DA - [2021] CY - Singapore : AU - Chowdary, P. Satish Rama. AU - Chakravarthy, V. V. S. S. Sameer. AU - Anguera, Jaume. AU - Satapathy, Suresh Chandra, AU - Bhateja, Vikrant. VL - v. 655 CN - TK7874 PB - Springer, PP - Singapore : PY - [2021] N1 - International conference proceedings. N1 - Low-Power and High-Speed 2-4 and 4-16 Decoders Using Modified Gate Diffusion Input (M-GDI) Technique ID - 1431639 KW - Microelectronics KW - Electromagnetism KW - Microélectronique KW - Électromagnétisme SN - 9789811538285 SN - 981153828X TI - Microelectronics, Electromagnetics and Telecommunications :proceedings of the fifth ICMEET 2019 / LK - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-3828-5 UR - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-3828-5 ER -