TY  - GEN
N2  - This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
DO  - 10.1007/978-981-15-6229-7
DO  - doi
AB  - This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
T1  - Advances in VLSI and embedded systems :select proceedings of AVES 2019 /
DA  - [2021]
CY  - Singapore :
AU  - Patel, Zuber.
AU  - Gupta, Shilpi.
AU  - Y. B., Nithin Kumar.
VL  - v. 676
CN  - TK7874
PB  - Springer,
PP  - Singapore :
PY  - [2021]
ID  - 1431853
KW  - Integrated circuits
KW  - Embedded computer systems
KW  - Circuits intégrés à très grande échelle
KW  - Systèmes enfouis (Informatique)
SN  - 9789811562297
SN  - 9811562296
SN  - 9789811562303
SN  - 981156230X
SN  - 9789811562310
SN  - 9811562318
TI  - Advances in VLSI and embedded systems :select proceedings of AVES 2019 /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-6229-7
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-6229-7
ER  -