TY  - GEN
N2  - This book contains a selection of research articles written by prominent researchers participating in The 27th World Congress on Engineering (WCE 2019) which was held in London, UK, July 3-5, 2019. Topics covered include engineering mathematics, electrical engineering, communications systems, computer science, chemical engineering, systems engineering, manufacturing engineering, and industrial applications. With contributions carefully chosen to represent the most cutting-edge research presented during the conference, the book contains some of the state of the art in engineering technologies and the physical sciences and their applications and serves as a useful reference for researchers and graduate students working in these fields.
DO  - 10.1007/978-981-15-8273-8
DO  - doi
AB  - This book contains a selection of research articles written by prominent researchers participating in The 27th World Congress on Engineering (WCE 2019) which was held in London, UK, July 3-5, 2019. Topics covered include engineering mathematics, electrical engineering, communications systems, computer science, chemical engineering, systems engineering, manufacturing engineering, and industrial applications. With contributions carefully chosen to represent the most cutting-edge research presented during the conference, the book contains some of the state of the art in engineering technologies and the physical sciences and their applications and serves as a useful reference for researchers and graduate students working in these fields.
T1  - Transactions on engineering technologies :World Congress on Engineering 2019 /
AU  - Ao, Sio-Iong,
AU  - Gelman, Len,
AU  - Kim, Haeng-Kon,
CN  - TA145
ID  - 1432309
KW  - Engineering
KW  - Computer engineering
KW  - Ingénierie
KW  - Ordinateurs
SN  - 9789811582738
SN  - 9811582734
TI  - Transactions on engineering technologies :World Congress on Engineering 2019 /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-8273-8
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-8273-8
ER  -