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001432458 001__ 1432458
001432458 003__ OCoLC
001432458 005__ 20230309003444.0
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001432458 008__ 201013t20212021sz\a\\\\ob\\\\001\0\eng\d
001432458 019__ $$a1228843730$$a1237473439$$a1241066524$$a1249943790
001432458 020__ $$a9783030516109$$q(electronic bk.)
001432458 020__ $$a3030516105$$q(electronic bk.)
001432458 020__ $$z9783030516093$$q(hardcover)
001432458 0247_ $$a10.1007/978-3-030-51610-9$$2doi
001432458 035__ $$aSP(OCoLC)1204152219
001432458 040__ $$aSFB$$beng$$erda$$epn$$cSFB$$dOCLCO$$dOCLCF$$dYDXIT$$dOCLCO$$dGW5XE$$dUPM$$dOCLCO$$dOCL$$dGZM$$dOCLCQ$$dYDX$$dLEATE$$dWAU$$dOCLCQ$$dOCLCO$$dOCLCQ
001432458 049__ $$aISEA
001432458 050_4 $$aTK7874.75
001432458 050_4 $$aTK7888.4$$b.G43 2021
001432458 08204 $$a621.39/5$$223
001432458 08204 $$a621.3815$$223
001432458 1001_ $$aGhavami, Behnam,$$eauthor.
001432458 24510 $$aSoft error reliability of VLSI circuits :$$banalysis and mitigation techniques /$$cBehnam Ghavami, Mohsen Raji.
001432458 264_1 $$aCham, Switzerland :$$bSpringer,$$c[2021]
001432458 264_4 $$c©2021
001432458 300__ $$a1 online resource (xiii, 114 pages) :$$billustrations
001432458 336__ $$atext$$btxt$$2rdacontent
001432458 337__ $$acomputer$$bc$$2rdamedia
001432458 338__ $$aonline resource$$bcr$$2rdacarrier
001432458 347__ $$atext file$$2rdaft
001432458 347__ $$bPDF
001432458 504__ $$aIncludes bibliographical references and index.
001432458 5050_ $$aIntroduction: Soft Error Modeling -- Soft Error Rate Estimation of VLSI circuits -- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits -- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits -- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits -- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing -- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
001432458 506__ $$aAccess limited to authorized users.
001432458 520__ $$aThis book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Provides an accessible, comprehensive introduction to soft errors; Describes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuits; Includes state-of-the art soft error aware CAD algorithms; Describes practical soft error aware synthesis techniques for commercial large-scale VLSI designs.
001432458 588__ $$aOnline resource; title from digital title page (viewed on December 28, 2020).
001432458 650_0 $$aIntegrated circuits$$xVery large scale integration$$xReliability.
001432458 650_0 $$aElectronic circuits.
001432458 650_0 $$aElectronics.
001432458 650_0 $$aMicroelectronics.
001432458 650_0 $$aComputer engineering.
001432458 650_0 $$aInternet of things.
001432458 650_0 $$aEmbedded computer systems.
001432458 650_6 $$aCircuits intégrés à très grande échelle$$xFiabilité.
001432458 650_6 $$aCircuits électroniques.
001432458 650_6 $$aÉlectronique.
001432458 650_6 $$aMicroélectronique.
001432458 650_6 $$aOrdinateurs$$xConception et construction.
001432458 650_6 $$aInternet des objets.
001432458 650_6 $$aSystèmes enfouis (Informatique)
001432458 655_0 $$aElectronic books.
001432458 7001_ $$aRaji, Mohsen,$$eauthor.
001432458 77608 $$iPrint version:$$aGHAVAMI, BEHNAM. RAJI, MOHSEN.$$tSOFT ERROR RELIABILITY OF VLSI CIRCUITS.$$d[S.l.] : SPRINGER NATURE, 2020$$z3030516091$$w(OCoLC)1155560727
001432458 852__ $$bebk
001432458 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-030-51610-9$$zOnline Access$$91397441.1
001432458 909CO $$ooai:library.usi.edu:1432458$$pGLOBAL_SET
001432458 980__ $$aBIB
001432458 980__ $$aEBOOK
001432458 982__ $$aEbook
001432458 983__ $$aOnline
001432458 994__ $$a92$$bISE