Near infrared detectors based on silicon supersaturated with transition metals / Daniel Montero Álvarez.
2021
TA1570
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Title
Near infrared detectors based on silicon supersaturated with transition metals / Daniel Montero Álvarez.
Author
ISBN
9783030638269 (electronic bk.)
303063826X (electronic bk.)
3030638251
9783030638252
303063826X (electronic bk.)
3030638251
9783030638252
Publication Details
Cham : Springer, 2021.
Language
English
Description
1 online resource (262 pages)
Item Number
10.1007/978-3-030-63826-9 doi
Call Number
TA1570
Dewey Decimal Classification
621.36/2
539.77
620.11295
620.11297
539.77
620.11295
620.11297
Summary
This thesis makes a significant contribution to the development of cheaper Si-based Infrared detectors, operating at room temperature. In particular, the work is focused in the integration of the Ti supersaturated Si material into a CMOS Image Sensor route, the technology of choice for imaging nowadays due to its low-cost and high resolution. First, the material is fabricated using ion implantation of Ti atoms at high concentrations. Afterwards, the crystallinity is recovered by means of a pulsed laser process. The material is used to fabricate planar photodiodes, which are later characterized using current-voltage and quantum efficiency measurements. The prototypes showed improved sub-bandgap responsivity up to 0.45 eV at room temperature. The work is further supported by a collaboration with STMicroelectronics, where the supersaturated material was integrated into CMOS-based sensors at industry level. The results show that Ti supersaturated Si is compatible in terms of contamination, process integration and uniformity. The devices showed similar performance to non-implanted devices in the visible region. This fact leaves the door open for further integration of supersaturated materials into CMOS Image Sensors.
Note
Doctoral Thesis accepted by Universidad Complutense de Madrid, Madrid, Spain.
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Table of Contents
Introduction
Experimental techniques
Results: NLA using a short pulse duration KrF laser
Results: NLA using a long pulse duration XeCl laser
Results: Integrating the supersaturated material in a CMOS pixel matrix.
Experimental techniques
Results: NLA using a short pulse duration KrF laser
Results: NLA using a long pulse duration XeCl laser
Results: Integrating the supersaturated material in a CMOS pixel matrix.