TY  - GEN
N2  - This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon. Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering.
DO  - 10.1007/978-981-16-0025-8
DO  - doi
AB  - This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon. Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering.
T1  - Software reliability growth models /
AU  - Hanagal, David D.,
AU  - Bhalerao, Nileema N.,
CN  - QA76.76.R44
ID  - 1434527
KW  - Computer software
KW  - Logiciels
SN  - 9789811600258
SN  - 9811600252
SN  - 9789811600265
SN  - 9811600260
SN  - 9789811600272
SN  - 9811600279
TI  - Software reliability growth models /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-16-0025-8
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-16-0025-8
ER  -