Software reliability growth models / David D. Hanagal, Nileema N. Bhalerao.

Unlimited

Authorized users

Can lend chapters, not whole ebooks

Software reliability growth models / David D. Hanagal, Nileema N. Bhalerao.

9789811600258 (electronic bk.)
9811600252 (electronic bk.)
9789811600265 (print)
9811600260
9789811600272 (print)
9811600279
9811600244
9789811600241

Singapore : Springer, [2021]

English

1 online resource.

10.1007/978-981-16-0025-8 doi

QA76.76.R44

005

This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon. Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering.

Includes bibliographical references and index.

Access limited to authorized users.

text file
PDF

Online resource; title from PDF title page (SpringerLink, viewed March 29, 2021).

Infosys Science Foundation series. Mathematical sciences.

Online Resources > Ebooks
All Resources