Pattern Recognition : ICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings. Part VII / Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani (eds.).
2021
TA1634
Linked e-resources
Linked Resource
Online Access
Concurrent users
Unlimited
Authorized users
Authorized users
Document Delivery Supplied
Can lend chapters, not whole ebooks
Details
Title
Pattern Recognition : ICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings. Part VII / Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani (eds.).
ISBN
9783030687878 (electronic book)
3030687872 (electronic book)
3030687872 (electronic book)
Published
Cham, Switzerland : Springer, [2021]
Language
English
Description
1 online resource (xix, 685 pages) : illustrations (some color)
Item Number
10.1007/978-3-030-68787-8 doi
Call Number
TA1634
Dewey Decimal Classification
006.3/7
Summary
This 8-volumes set constitutes the refereed of the 25th International Conference on Pattern Recognition Workshops, ICPR 2020, held virtually in Milan, Italy and rescheduled to January 10 - 11, 2021 due to Covid-19 pandemic. The 416 full papers presented in these 8 volumes were carefully reviewed and selected from about 700 submissions. The 46 workshops cover a wide range of areas including machine learning, pattern analysis, healthcare, human behavior, environment, surveillance, forensics and biometrics, robotics and egovision, cultural heritage and document analysis, retrieval, and women at ICPR2020.
Bibliography, etc. Note
Includes bibliographical references and author index.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file
PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed March 19, 2021).
Added Author
Del Bimbo, Alberto, editor
Cucchiara, Rita, editor
Sclaroff, Stan, editor
Farinella, Giovanni Maria, editor
Mei, Tao, editor.
Bertini, Marco, editor
Escalante, Hugo Jair, editor
Vezzani, Roberto, editor
Cucchiara, Rita, editor
Sclaroff, Stan, editor
Farinella, Giovanni Maria, editor
Mei, Tao, editor.
Bertini, Marco, editor
Escalante, Hugo Jair, editor
Vezzani, Roberto, editor
Series
Lecture notes in computer science ; 12667. 0302-9743
LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
Available in Other Form
Print version: 9783030687861
Print version: 9783030687885
Print version: 9783030687885
Linked Resources
Online Access
Record Appears in
Online Resources > Ebooks
All Resources
All Resources
Table of Contents
PATCAST
International Workshop on Pattern Forecasting
PATRECH2020
II International Workshop on Pattern Recognition for Cultural Heritage
PRAConBE
Pattern Recognition and Automation in Construction and the Built Environment
PRRS 2020
11th IAPR Workshop on Pattern REcognition in REmote Sensing
RISS 2020
International WOrkshop on Research and Innovation for Secure Societies.
International Workshop on Pattern Forecasting
PATRECH2020
II International Workshop on Pattern Recognition for Cultural Heritage
PRAConBE
Pattern Recognition and Automation in Construction and the Built Environment
PRRS 2020
11th IAPR Workshop on Pattern REcognition in REmote Sensing
RISS 2020
International WOrkshop on Research and Innovation for Secure Societies.