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Title
X-ray phase-contrast imaging using near-field speckles / Marie-Christine Zdora.
Edition
1st ed. 2021.
ISBN
3030663299 (electronic book)
9783030663292 (electronic book)
3030663280
9783030663285
Published
Cham, Switzerland : Springer, [2021]
Language
English
Description
1 online resource (xxi, 337 pages, 102 illustrations, 88 illustrations in color)
Item Number
10.1007/978-3-030-66329-2. doi
Call Number
QC762.6.M34 Z36 2021
Dewey Decimal Classification
538/.36
Summary
This thesis presents research on novel X-ray imaging methods that improve the study of specimens with small density differences, revealing their inner structure and density distribution. Exploiting the phase shift of X-rays in a material can significantly increase the image contrast compared to conventional absorption imaging. This thesis provides a practical guide to X-ray phase-contrast imaging with a strong focus on X-ray speckle-based imaging, the most recently developed phase-sensitive method. X-ray speckle-based imaging only requires a piece of abrasive paper in addition to the standard X-ray imaging setup. Its simplicity and robustness combined with the compatibility with laboratory X-ray sources, make it an ideal candidate for wide user uptake in a range of fields. An in-depth overview of the state of the art of X-ray speckle-based imaging and its latest developments is given in this thesis. It, furthermore, explores a broad range of applications, from X-ray optics characterisation, to biomedical imaging for 3D virtual histology and geological studies of volcanic rocks, demonstrating is promising potential. Moreover, the speckle-based technique is placed in the context of other phase-sensitive X-ray imaging methods to assist in the choice of a suitable method, hence serving as a guide and reference work for future users.
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file
PDF
Source of Description
Online resource; title from digital title page (viewed on May 18, 2021).
Series
Springer theses. 2190-5053
Introduction
Principles of X-Ray Imaging
Synchrotron Beamlines, Instrumentation and Contributions
X-ray Single-Grating Interferometry
Principles and State of the Art Of X-Ray Speckle-Based Imaging
The Unified Modulated Pattern Analysis
At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis
3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis
Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging
Summary, Conclusions and Outlook
Appendices.