TY - GEN N2 - This book provides systematic descriptions of design methods, typical techniques, and validation methods for lunar soft landers, covering their environmental design, system design, sub-system design, assembly, testing and ground test validation based on the Chang'e-3 mission. Offering readers a comprehensive, systematic and in-depth introduction to the technologies used in China's lunar soft landers, it presents detailed information on the design process for Chang'e-3, including methods and techniques that will be invaluable in future extraterrestrial soft lander design. As such, the book offers a unique reference guide for all researchers and professionals working on deep-space missions around the globe. DO - 10.1007/978-981-15-6580-9 DO - doi AB - This book provides systematic descriptions of design methods, typical techniques, and validation methods for lunar soft landers, covering their environmental design, system design, sub-system design, assembly, testing and ground test validation based on the Chang'e-3 mission. Offering readers a comprehensive, systematic and in-depth introduction to the technologies used in China's lunar soft landers, it presents detailed information on the design process for Chang'e-3, including methods and techniques that will be invaluable in future extraterrestrial soft lander design. As such, the book offers a unique reference guide for all researchers and professionals working on deep-space missions around the globe. T1 - Technology of lunar soft lander / AU - Yu, Deng-Yun, AU - Sun, Ze-Zhou, AU - Zhang, He, VL - volume 38 CN - TL875 LA - eng LA - In English; translated from the original Chinese. ID - 1435372 KW - Lunar excursion module KW - Space vehicles KW - Space vehicles KW - Aerospace engineering. KW - Véhicules spatiaux KW - Véhicules spatiaux KW - Aérospatiale (Ingénierie) SN - 9789811565809 SN - 9811565805 TI - Technology of lunar soft lander / LK - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-6580-9 UR - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-15-6580-9 ER -