@article{1436242,
      recid = {1436242},
      author = {Huhn, Sebastian. and Drechsler, Rolf.},
      title = {Design for testability, debug and reliability : next  generation measures using formal techniques /},
      publisher = {Springer,},
      address = {Cham :},
      pages = {1 online resource (177 pages)},
      year = {2021},
      abstract = {This book introduces several novel approaches to pave the  way for the next generation of integrated circuits, which  can be successfully and reliably integrated, even in  safety-critical applications. The authors describe new  measures to address the rising challenges in the field of  design for testability, debug, and reliability, as strictly  required for state-of-the-art circuit designs. In  particular, this book combines formal techniques, such as  the Satisfiability (SAT) problem and the Bounded Model  Checking (BMC), to address the arising challenges  concerning the increase in test data volume, as well as  test application time and the required reliability. All  methods are discussed in detail and evaluated extensively,  while considering industry-relevant benchmark candidates.  All measures have been integrated into a common framework,  which implements standardized software/hardware interfaces.  Provides readers with a combination of a comprehensive set  of formal techniques covering and enhancing different  aspects of the state-of-the-art design and test flow for  ICs; Introduces newly developed heuristic, formal  optimization-based and partition-based retargeting  techniques and integrates them into a common framework;  Describes fully compliant (with respect to industrial  de-facto standard) measures to enhance the DFT, DFD and DFR  capabilities while supporting standardized data exchange  formats; Includes new measures to tackle shortcomings of  existing state-of-the-art methods, including zero-defect  enforcing safety-critical applications.},
      url = {http://library.usi.edu/record/1436242},
      doi = {https://doi.org/10.1007/978-3-030-69209-4},
}