@article{1437044,
      recid = {1437044},
      author = {Meyer, E. and Hug, Hans J. and Bennewitz, Roland,},
      title = {Scanning probe microscopy : the lab on a tip /},
      pages = {1 online resource (xiv, 322 pages).},
      abstract = {Written by three leading experts in the field, this book  describes and explains all essential aspects of scanning  probe microscopy. Emphasis is placed on the experimental  design and procedures required to optimize the performance  of the various methods described. The book covers not only  the physical principles behind this popular technique, but  also tackles questions on instrument design, the basic  features of the different imaging modes, and recurring  artifacts. Novel applications and the latest research  results are presented, and the book closes with a look at  the future prospects of scanning probe microscopy, while  also discussing related techniques in the field of  nanoscience. This second edition includes essential  scientific updates reflecting the latest research, as well  as coverage of new breakthroughs in techniques such as  submolecular imaging by atomic force microscopy (AFM),  multifrequency AFM, high-speed imaging of biological  matter, scanning x-ray microscopy, and tip-enhanced Raman  scattering. The book serves as a general, hands-on guide  for all types of classes that address scanning probe  microscopy. It is ideally suited for graduate and advanced  undergraduate students, either for self-study or as a  textbook for a dedicated course on the topic. Furthermore,  it is an essential component of any scanning probe  microscopy laboratory course and a valuable resource for  practicing researchers developing and using scanning probe  techniques.},
      url = {http://library.usi.edu/record/1437044},
      doi = {https://doi.org/10.1007/978-3-030-37089-3},
}