TY  - GEN
N2  - This book constitutes the refereed proceedings of the 28th International Symposium on Static Analysis, SAS 2021, held in Chicago, IL, USA, in October 2021. The 18 regular and 4 short papers, carefully reviewed and selected from 48 submissions, are presented in this book together with 1-page summaries of the three invited talks. The papers cover topics such as static program analysis, abstract domain, abstract interpretation, automated deduction, debugging techniques, deductive methods, model checking, data science, program optimizations and transformations, program synthesis, program verification, and security analysis.
DO  - 10.1007/978-3-030-88806-0
DO  - doi
AB  - This book constitutes the refereed proceedings of the 28th International Symposium on Static Analysis, SAS 2021, held in Chicago, IL, USA, in October 2021. The 18 regular and 4 short papers, carefully reviewed and selected from 48 submissions, are presented in this book together with 1-page summaries of the three invited talks. The papers cover topics such as static program analysis, abstract domain, abstract interpretation, automated deduction, debugging techniques, deductive methods, model checking, data science, program optimizations and transformations, program synthesis, program verification, and security analysis.
T1  - Static analysis :28th international symposium, SAS 2021, Chicago, IL, USA, proceedings /
DA  - 2021.
CY  - Cham, Switzerland :
AU  - Drăgoi, Cezara,
AU  - Mukherjee, Suvam,
AU  - Namjoshi, Kedar S.,
VL  - 12913
CN  - QA76.6
PB  - Springer,
PP  - Cham, Switzerland :
PY  - 2021.
N1  - Includes author index.
ID  - 1440341
KW  - Computer programming
KW  - Software engineering
KW  - Programmation (Informatique)
KW  - Génie logiciel
SN  - 9783030888060
SN  - 3030888061
TI  - Static analysis :28th international symposium, SAS 2021, Chicago, IL, USA, proceedings /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-030-88806-0
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-030-88806-0
ER  -