TY  - GEN
N2  - This textbook highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as static electricity, electric fast transient (EFT) and surge. With case studies and solved examples, the book provides effective solutions to actual engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem-solving.
DO  - 10.1007/978-981-16-6452-6
DO  - doi
AB  - This textbook highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as static electricity, electric fast transient (EFT) and surge. With case studies and solved examples, the book provides effective solutions to actual engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem-solving.
T1  - Electromagnetic compatibility :principles and applications /
DA  - 2021.
CY  - Singapore :
AU  - Zhao, Yang.
AU  - Yan, Wei.
AU  - Sun, Jun.
AU  - Zhou, Mengxia.
AU  - Meng, Zhaojuan.
CN  - TK7867.2
PB  - Springer,
PP  - Singapore :
PY  - 2021.
ID  - 1441643
KW  - Electromagnetic compatibility.
KW  - Compatibilité électromagnétique.
SN  - 9789811664526
SN  - 9811664528
TI  - Electromagnetic compatibility :principles and applications /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-16-6452-6
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-16-6452-6
ER  -