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Gallium nitride semiconductor devices
Compact modeling
Introduction to ASM-HEMT compact model
Core formulations in ASM-HEMT model
Non-ideal effects in device current and their modeling
Trapping models
Non-ideal effects in GaN capacitances and their modeling
Gate current model
Effect of ambient temperature on GaN device
Noise models
Parameter extraction in ASM-HEMT model
Advance simulations with ASM-HEMT model
Resources for ASM-HEMT model users.

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