Advanced X-ray detector technologies : design and applications / Krzysztof (Kris) Iniewski, editors.
Iniewski, Krzysztof, 1960- editor.
2022
QC481
Available Online

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Title
Advanced X-ray detector technologies : design and applications / Krzysztof (Kris) Iniewski, editors.
ISBN
9783030642792 (electronic bk.)
3030642798 (electronic bk.)
303064278X
9783030642785
DOI
https://doi.org/10.1007/978-3-030-64279-2
Publication Details
Cham, Switzerland : Springer, 2022.
Language
English
Description
1 online resource
Item Number
10.1007/978-3-030-64279-2 doi
Call Number
QC481
Dewey Decimal Classification
571.4/57
Summary
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Note
Includes index.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed February 1, 2022).
Added Author
Iniewski, Krzysztof, 1960- editor.
Available in Other Form
Print version: 9783030642785
Linked Resources
Online Access
Record Appears in
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All Resources
Introduction to High-Z Semiconductor Detectors
High-Z compound semiconductors as sensors for hybrid pixel area detectors
Photon-integrating hybrid pixel array detectors for high-energy x-ray applications
Photon counting detectors and their applications in medical imaging
CZT Detectors for High-Flux
Position-sensitive virtual Frisch-grid CdZnTe detectors and their applications
Drift detectors and Compton cameras
CdTe Pixel Detectors for Hard X-Ray Astronomy
High-Z pixel sensor characterization for synchrotron applications
High Performance CdTe/CZT Spectro-Imagers.

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