Reliability of organic compounds in microelectronics and optoelectronics : from physics-of-failure to physics-of-degradation / Willem Dirk van Driel, Maryam Yazdan Mehr, editors.
Driel, Willem Dirk van, editor.; Yazdan Mehr, Maryam, editor.
2022
TK7871 .R45 2022
Available Online

Linked e-resources

Linked Resource
Online Access
Concurrent users
Unlimited
Authorized users
Authorized users
Document Delivery Supplied
Can lend chapters, not whole ebooks

Details

Title
Reliability of organic compounds in microelectronics and optoelectronics : from physics-of-failure to physics-of-degradation / Willem Dirk van Driel, Maryam Yazdan Mehr, editors.
ISBN
9783030815769 (electronic bk.)
3030815765 (electronic bk.)
9783030815752
3030815757
DOI
https://doi.org/10.1007/978-3-030-81576-9
Published
Cham : Springer, [2022]
Copyright
©2022
Language
English
Description
1 online resource : illustrations (chiefly color)
Item Number
10.1007/978-3-030-81576-9 doi
Call Number
TK7871 .R45 2022
Dewey Decimal Classification
621.3815
Summary
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.
Note
Includes index.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed February 17, 2022).
Added Author
Driel, Willem Dirk van, editor.
Yazdan Mehr, Maryam, editor.
Available in Other Form
Print version: 9783030815752
Linked Resources
Online Access
Record Appears in
Online Resources > Ebooks
All Resources
Introduction to reliability
Introduction to failure analysis methodologies
An overview of remaining life assessment methodologies in engineering materials
Reliability and failure of microelectronic materials and components in harsh working conditions
Reliability and failure of solar cell materials and systems in harsh working conditions
Electromigration-induced failures in microelectronic components
Corrosion and degradation of metals
Creep failures in high temperature alloys
An overview of failures in boilers and heat exchangers in power plants
Fatigue-related failures
Degradation and failure of polymers
Virtual prototyping techniques for prediction material degradation
Health monitoring, machine learning and digital twin.-Discussions and concluding remarks
Index.

Browse Subjects

Show more subjects...

Statistics

from
to
Export