001444093 000__ 04420cam\a2200577Ii\4500
001444093 001__ 1444093
001444093 003__ OCoLC
001444093 005__ 20230310003652.0
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001444093 008__ 220202s2022\\\\sz\a\\\\o\\\\\001\0\eng\d
001444093 019__ $$a1294921682$$a1295276561$$a1296427017$$a1296665805
001444093 020__ $$a9783030815769$$q(electronic bk.)
001444093 020__ $$a3030815765$$q(electronic bk.)
001444093 020__ $$z9783030815752
001444093 020__ $$z3030815757
001444093 0247_ $$a10.1007/978-3-030-81576-9$$2doi
001444093 035__ $$aSP(OCoLC)1294828821
001444093 040__ $$aYDX$$beng$$erda$$epn$$cYDX$$dGW5XE$$dDKU$$dEBLCP$$dOCLCO$$dOCLCF$$dUKAHL$$dOCLCQ
001444093 049__ $$aISEA
001444093 050_4 $$aTK7871$$b.R45 2022
001444093 08204 $$a621.3815$$223
001444093 24500 $$aReliability of organic compounds in microelectronics and optoelectronics :$$bfrom physics-of-failure to physics-of-degradation /$$cWillem Dirk van Driel, Maryam Yazdan Mehr, editors.
001444093 264_1 $$aCham :$$bSpringer,$$c[2022]
001444093 264_4 $$c©2022
001444093 300__ $$a1 online resource :$$billustrations (chiefly color)
001444093 336__ $$atext$$btxt$$2rdacontent
001444093 337__ $$acomputer$$bc$$2rdamedia
001444093 338__ $$aonline resource$$bcr$$2rdacarrier
001444093 347__ $$atext file$$bPDF$$2rda
001444093 500__ $$aIncludes index.
001444093 5050_ $$aIntroduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin.-Discussions and concluding remarks -- Index.
001444093 506__ $$aAccess limited to authorized users.
001444093 520__ $$aThis book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.
001444093 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed February 17, 2022).
001444093 650_0 $$aMicroelectronics$$xMaterials.
001444093 650_0 $$aOptoelectronics$$xMaterials.
001444093 650_0 $$aFunctional organic materials$$xDeterioration.
001444093 650_0 $$aFunctional organic materials$$xFatigue.
001444093 650_6 $$aMicroélectronique$$xMatériaux.
001444093 650_6 $$aOptoélectronique$$xMatériaux.
001444093 655_0 $$aElectronic books.
001444093 7001_ $$aDriel, Willem Dirk van,$$eeditor.
001444093 7001_ $$aYazdan Mehr, Maryam,$$eeditor.
001444093 77608 $$iPrint version: $$z3030815757$$z9783030815752$$w(OCoLC)1257402878
001444093 852__ $$bebk
001444093 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-030-81576-9$$zOnline Access$$91397441.1
001444093 909CO $$ooai:library.usi.edu:1444093$$pGLOBAL_SET
001444093 980__ $$aBIB
001444093 980__ $$aEBOOK
001444093 982__ $$aEbook
001444093 983__ $$aOnline
001444093 994__ $$a92$$bISE