001444403 000__ 03043cam\a2200517Ia\4500
001444403 001__ 1444403
001444403 003__ OCoLC
001444403 005__ 20230310003708.0
001444403 006__ m\\\\\o\\d\\\\\\\\
001444403 007__ cr\un\nnnunnun
001444403 008__ 220215s2022\\\\si\\\\\\o\\\\\000\0\eng\d
001444403 019__ $$a1296911249$$a1296943535$$a1298394739$$a1299385196
001444403 020__ $$a9789811651014$$q(electronic bk.)
001444403 020__ $$a9811651019$$q(electronic bk.)
001444403 020__ $$z9811651000
001444403 020__ $$z9789811651007
001444403 0247_ $$a10.1007/978-981-16-5101-4$$2doi
001444403 035__ $$aSP(OCoLC)1296677199
001444403 040__ $$aYDX$$beng$$cYDX$$dGW5XE$$dEBLCP$$dOCLCO$$dOCLCF$$dUKAHL$$dOCLCQ
001444403 049__ $$aISEA
001444403 050_4 $$aQH212.E4
001444403 08204 $$a502.8/25$$223
001444403 24500 $$aElectron microscopy in science and engineering /$$cKrishanu Biswas, Sri Sivakumar, Nilesh Gurao, editors.
001444403 260__ $$aSingapore :$$bSpringer,$$c2022.
001444403 300__ $$a1 online resource
001444403 4901_ $$aIITK directions ;$$vvolume 6
001444403 5050_ $$aSmall scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.
001444403 506__ $$aAccess limited to authorized users.
001444403 520__ $$aThis issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.
001444403 588__ $$aDescription based on print version record.
001444403 650_0 $$aElectron microscopy.
001444403 650_0 $$aElectron microscopy$$xIndustrial applications.
001444403 650_6 $$aMicroscopie électronique.
001444403 650_6 $$aMicroscopie électronique$$xApplications industrielles.
001444403 655_0 $$aElectronic books.
001444403 7001_ $$aBiswas, Krishanu,$$eeditor.
001444403 7001_ $$aSivakumar, Sri,$$eeditor.
001444403 7001_ $$aGurao, Nilesh,$$eeditor.
001444403 77608 $$iPrint version: $$z9811651000$$z9789811651007$$w(OCoLC)1259048442
001444403 830_0 $$aIITK directions ;$$vv. 6.
001444403 852__ $$bebk
001444403 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-16-5101-4$$zOnline Access$$91397441.1
001444403 909CO $$ooai:library.usi.edu:1444403$$pGLOBAL_SET
001444403 980__ $$aBIB
001444403 980__ $$aEBOOK
001444403 982__ $$aEbook
001444403 983__ $$aOnline
001444403 994__ $$a92$$bISE