@article{1447850,
      note = {Includes index.},
      author = {Kamaraj, Sathish-Kumar. and Thirumurugan, Arun. and  Dhanabalan, Shanmuga Sundar. and Hevia, Samuel.},
      url = {http://library.usi.edu/record/1447850},
      title = {Microscopic techniques for the non-expert/},
      publisher = {Springer,},
      abstract = {This book covers fundamental microscopic techniques for  Scanning Electron Microscopy (SEM), Transmission Electron  Microscopy (TEM), Atomic Force Microscopy (AFM), and other  microscopic tools. It provides step-by-step instructions  and explanations of the basic fundamental concepts and  mechanisms and guides the reader on resolving queries  related to taking and analyzing microscopy images. The  latest advancements and developments in microscopic  equipment are described. Theoretical background on  microscopy is also provided to enhance the readers  understanding of microscopy techniques and tools.  Microscopic Techniques for the Non-Expert is an ideal book  for undergraduate and postgraduate students, as well as  researchers with a background in environmental science,  materials science, biomedicine, engineering, or  bio-nanotechnology.},
      doi = {https://doi.org/10.1007/978-3-030-99542-3},
      recid = {1447850},
      pages = {1 online resource},
      address = {Cham, Switzerland :},
      year = {2022},
}