TY  - GEN
N2  - This proceedings focus on selected aspects of recent advances and experiences, emerging technology trends that have positively impacted our world from operators, authorities and associations from around the world to help address the worlds computing, control and industrial engineering. Meanwhile, although the group that studies Computing, Control and Industrial Engineering is very large, the topics included into this proceedings have the extremely high research value. The program chair, speakers, and editors of this conference are well-known person in the industry, and CCIE2021 will also strictly select articles when calling for papers. .
DO  - 10.1007/978-981-19-3927-3
DO  - doi
AB  - This proceedings focus on selected aspects of recent advances and experiences, emerging technology trends that have positively impacted our world from operators, authorities and associations from around the world to help address the worlds computing, control and industrial engineering. Meanwhile, although the group that studies Computing, Control and Industrial Engineering is very large, the topics included into this proceedings have the extremely high research value. The program chair, speakers, and editors of this conference are well-known person in the industry, and CCIE2021 will also strictly select articles when calling for papers. .
T1  - 6th International Technical Conference on Advances in Computing Control and Industrial Engineering (CCIE 2021) /
AU  - Shmaliy, Yuriy,
AU  - Zekry, Abdelhalim Abdelnaby,
VL  - volume 920
CN  - TJ217.5
N1  - Conference proceedings.
N1  - Conference held online due to the COVID-19 pandemic.
N1  - Includes author index.
ID  - 1448010
KW  - Intelligent control systems
KW  - Computer systems
KW  - Control theory
SN  - 9789811939273
SN  - 9811939276
TI  - 6th International Technical Conference on Advances in Computing Control and Industrial Engineering (CCIE 2021) /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-3927-3
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-3927-3
ER  -