@article{1449795,
      recid = {1449795},
      author = {Sastry, Gunturi Venkata Sitarama.},
      title = {Microstructural characterisation techniques /},
      publisher = {Springer,},
      address = {Singapore :},
      pages = {1 online resource (254 p.).},
      year = {2022},
      abstract = {This textbook is aimed at graduate and upper undergraduate  students studying materials science and metallurgy. It  comprehensively covers the topic of microstructural  characterization and includes an emphasis on Fourier  analysis and Fourier transformation, electron diffraction,  electromagnetic waves and electron waves, lens parameters,  transmission electron microscopy, optical microscopy and  scanning electron microscopy. The author has included  pedagogical features such as end-of-chapter exercises and  worked examples with varying degrees of difficulty to  augment learning and self-testing. This book will be a  useful guide for upper undergraduate and graduate students  along with researchers and professionals working in the  field of microstructural characterization.},
      url = {http://library.usi.edu/record/1449795},
      doi = {https://doi.org/10.1007/978-981-19-3509-1},
}