TY  - GEN
AB  - This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
AU  - Sastry, Gunturi Venkata Sitarama.
CN  - TA407
CY  - Singapore :
DA  - 2022.
DO  - 10.1007/978-981-19-3509-1
DO  - doi
ID  - 1449795
KW  - Microstructure
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-3509-1
N2  - This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
PB  - Springer,
PP  - Singapore :
PY  - 2022.
SN  - 9789811935091
SN  - 9811935092
T1  - Microstructural characterisation techniques /
TI  - Microstructural characterisation techniques /
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-3509-1
ER  -