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001449795 001__ 1449795
001449795 003__ OCoLC
001449795 005__ 20230310004418.0
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001449795 008__ 220924s2022\\\\si\\\\\\ob\\\\000\0\eng\d
001449795 019__ $$a1344537056
001449795 020__ $$a9789811935091$$q(electronic bk.)
001449795 020__ $$a9811935092$$q(electronic bk.)
001449795 020__ $$z9811935084
001449795 020__ $$z9789811935084
001449795 0247_ $$a10.1007/978-981-19-3509-1$$2doi
001449795 035__ $$aSP(OCoLC)1345585593
001449795 040__ $$aEBLCP$$beng$$cEBLCP$$dGW5XE$$dYDX$$dEBLCP$$dOCLCQ
001449795 049__ $$aISEA
001449795 050_4 $$aTA407
001449795 08204 $$a620.1/1299$$223/eng/20220927
001449795 1001_ $$aSastry, Gunturi Venkata Sitarama.
001449795 24510 $$aMicrostructural characterisation techniques /$$cGunturi Venkata Sitarama Sastry.
001449795 260__ $$aSingapore :$$bSpringer,$$c2022.
001449795 300__ $$a1 online resource (254 p.).
001449795 4901_ $$aIndian Institute of Metals series.
001449795 504__ $$aIncludes bibliographical references.
001449795 5050_ $$aIntroduction -- Electromagnetic Waves and Electron Waves -- Fourier Analysis and Fourier Transformation -- Transmission Electron Microscope -- Electron Diffraction -- Optical Microscopy -- Transmission Electron Microscopy -- Lens-less Electron Microscopy.
001449795 506__ $$aAccess limited to authorized users.
001449795 520__ $$aThis textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
001449795 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed September 27, 2022).
001449795 650_0 $$aMicrostructure$$xTechnique.
001449795 655_0 $$aElectronic books.
001449795 77608 $$iPrint version:$$aSastry, Gunturi Venkata Sitarama$$tMicrostructural Characterisation Techniques$$dSingapore : Springer,c2022$$z9789811935084
001449795 830_0 $$aIndian Institute of Metals series.
001449795 852__ $$bebk
001449795 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-3509-1$$zOnline Access$$91397441.1
001449795 909CO $$ooai:library.usi.edu:1449795$$pGLOBAL_SET
001449795 980__ $$aBIB
001449795 980__ $$aEBOOK
001449795 982__ $$aEbook
001449795 983__ $$aOnline
001449795 994__ $$a92$$bISE