VLSI design and test : 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised selected papers / Ambika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu (eds.).
2022
TK7874.75
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Title
VLSI design and test : 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised selected papers / Ambika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu (eds.).
ISBN
9783031215148 (electronic bk.)
3031215141 (electronic bk.)
9783031215131
3031215133
3031215141 (electronic bk.)
9783031215131
3031215133
Published
Cham, Switzerland : Springer, 2022.
Language
English
Description
1 online resource (xviii, 596 pages) : illustrations (some color).
Item Number
10.1007/978-3-031-21514-8 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Summary
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
Note
Includes author index.
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Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed December 21, 2022).
Added Author
Series
Communications in computer and information science ; 1687. 1865-0937
Available in Other Form
Print version: 9783031215131
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