@article{1451949,
      recid = {1451949},
      author = {Shah, Ambika Prasad, and Dasgupta, Sudeb, and Darji,  Anand, and Tudu, Jaynarayan,},
      title = {VLSI design and test : 26th International Symposium, VDAT  2022, Jammu, India, July 17-19, 2022, Revised selected  papers /. VDAT (Symposium)},
      pages = {1 online resource (xviii, 596 pages) :},
      note = {Includes author index.},
      abstract = {This book constitutes the proceedings of the 26th  International Symposium on VLSI Design and Test, VDAT 2022,  which took place in Jammu, India, in July 2022. The 32  regular papers and 16 short papers presented in this volume  were carefully reviewed and selected from 220 submissions.  They were organized in topical sections as follows: Devices  and Technology; Sensors; Analog/Mixed Signal; Digital  Design; Emerging Technologies and Memory; System Design.},
      url = {http://library.usi.edu/record/1451949},
      doi = {https://doi.org/10.1007/978-3-031-21514-8},
}