001451949 000__ 02945cam\a2200577\i\4500
001451949 001__ 1451949
001451949 003__ OCoLC
001451949 005__ 20230310003334.0
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001451949 007__ cr\un\nnnunnun
001451949 008__ 221221s2022\\\\sz\a\\\\o\\\\\101\0\eng\d
001451949 019__ $$a1355565565
001451949 020__ $$a9783031215148$$q(electronic bk.)
001451949 020__ $$a3031215141$$q(electronic bk.)
001451949 020__ $$z9783031215131
001451949 020__ $$z3031215133
001451949 0247_ $$a10.1007/978-3-031-21514-8$$2doi
001451949 035__ $$aSP(OCoLC)1355683932
001451949 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dYDX$$dOCLCF
001451949 049__ $$aISEA
001451949 050_4 $$aTK7874.75
001451949 08204 $$a621.39/5$$223/eng/20221221
001451949 1112_ $$aVDAT (Symposium)$$n(26th :$$d2022 :$$cJammu and Kashmir, India)
001451949 24510 $$aVLSI design and test :$$b26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised selected papers /$$cAmbika Prasad Shah, Sudeb Dasgupta, Anand Darji, Jaynarayan Tudu (eds.).
001451949 2463_ $$aVDAT 2022
001451949 264_1 $$aCham, Switzerland :$$bSpringer,$$c2022.
001451949 300__ $$a1 online resource (xviii, 596 pages) :$$billustrations (some color).
001451949 336__ $$atext$$btxt$$2rdacontent
001451949 337__ $$acomputer$$bc$$2rdamedia
001451949 338__ $$aonline resource$$bcr$$2rdacarrier
001451949 4901_ $$aCommunications in computer and information science,$$x1865-0937 ;$$v1687
001451949 500__ $$aIncludes author index.
001451949 506__ $$aAccess limited to authorized users.
001451949 520__ $$aThis book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
001451949 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed December 21, 2022).
001451949 650_0 $$aIntegrated circuits$$xVery large scale integration$$xTesting$$vCongresses.
001451949 650_0 $$aIntegrated circuits$$xVery large scale integration$$xDesign and construction$$vCongresses.
001451949 655_7 $$aConference papers and proceedings.$$2fast$$0(OCoLC)fst01423772
001451949 655_0 $$aElectronic books.
001451949 7001_ $$aShah, Ambika Prasad,$$eeditor.$$0(orcid)0000-0003-0810-814X$$1https://orcid.org/0000-0003-0810-814X
001451949 7001_ $$aDasgupta, Sudeb,$$eeditor.$$1https://orcid.org/0000-0002-4044-1594
001451949 7001_ $$aDarji, Anand,$$eeditor.
001451949 7001_ $$aTudu, Jaynarayan,$$eeditor.
001451949 77608 $$iPrint version: $$z3031215133$$z9783031215131$$w(OCoLC)1347784112
001451949 830_0 $$aCommunications in computer and information science ;$$v1687.$$x1865-0937
001451949 852__ $$bebk
001451949 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-21514-8$$zOnline Access$$91397441.1
001451949 909CO $$ooai:library.usi.edu:1451949$$pGLOBAL_SET
001451949 980__ $$aBIB
001451949 980__ $$aEBOOK
001451949 982__ $$aEbook
001451949 983__ $$aOnline
001451949 994__ $$a92$$bISE