TY  - GEN
N2  - This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.
DO  - 10.1007/978-3-031-23028-8
DO  - doi
AB  - This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.
T1  - Structural, syntactic, and statistical pattern recognition :joint IAPR international workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings /
AU  - Krzyzak, Adam,
AU  - Suen, Ching Y.,
AU  - Torsello, Andrea,
AU  - Nobile, Nicola,
VL  - 13813
CN  - TK7882.P3
N1  - Includes author index.
ID  - 1452145
KW  - Pattern recognition systems
KW  - Computer vision
SN  - 9783031230288
SN  - 3031230280
TI  - Structural, syntactic, and statistical pattern recognition :joint IAPR international workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-23028-8
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-23028-8
ER  -