TY  - GEN
N2  - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the art aging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element.
DO  - 10.1007/978-3-031-15345-7
DO  - doi
AB  - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the art aging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element.
T1  - Lifetime reliability-aware design of integrated circuits /
DA  - [2023].
CY  - Cham :
AU  - Raji, Mohsen.
AU  - Ghavami, Behnam.
CN  - TK7874
PB  - Springer,
PP  - Cham :
PY  - [2023].
N1  - 5.1 Effect of Timing Yield Optimization
ID  - 1453288
KW  - Integrated circuits
KW  - Integrated circuits
SN  - 9783031153457
SN  - 3031153456
TI  - Lifetime reliability-aware design of integrated circuits /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-15345-7
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-15345-7
ER  -