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001453562 001__ 1453562
001453562 003__ OCoLC
001453562 005__ 20230314003433.0
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001453562 019__ $$a1355218517$$a1357115968
001453562 020__ $$a9783031190872$$q(electronic bk.)
001453562 020__ $$a3031190874$$q(electronic bk.)
001453562 020__ $$z3031190858
001453562 020__ $$z9783031190858
001453562 0247_ $$a10.1007/978-3-031-19087-2$$2doi
001453562 035__ $$aSP(OCoLC)1354993613
001453562 040__ $$aYDX$$beng$$cYDX$$dGW5XE$$dEBLCP$$dSTF$$dOCLCQ
001453562 049__ $$aISEA
001453562 050_4 $$aQH212.S33
001453562 08204 $$a502.8/2$$223/eng/20230109
001453562 1001_ $$aKim, Byung Il.
001453562 24510 $$aSelf-assembled water chains :$$ba scanning probe microscopy approach /$$cByung Il Kim.
001453562 260__ $$aCham, Switzerland :$$bSpringer,$$c2023.
001453562 300__ $$a1 online resource
001453562 504__ $$aIncludes bibliographical references and index.
001453562 5050_ $$aIntro -- Preface -- Contents -- About the Author -- Chapter 1: Introduction -- 1.1 Background and Significance -- 1.2 Cantilever-Based Optical Interfacial Force Microscopy -- 1.3 Traditional Liquid vs. Chain Water -- 1.4 Discovery of Self-Assembled Water Chains -- 1.5 Coil-to-Bridge Transitions of Self-Assembled Water Chains -- 1.6 Future Outlook of Self-Assembled Water Chains in Science and Technology -- References -- Chapter 2: Self-Assembly, Entropy Forces, and Kelvin Equation -- 2.1 Atomic Force Microscopy of Water on Surfaces -- 2.2 Self-Assembly
001453562 5058_ $$a2.3 Chemical Potential of Self-Assembled Water Chains -- 2.4 Random Walks and Entropy Forces -- 2.5 Freely Jointed Chain Model -- 2.6 The Kelvin Equation -- 2.7 Capillary Condensation Theory -- 2.8 Energy Minimization and Force-Distance Equation -- 2.9 Environmental Scanning Electron Microscopy -- 2.10 Conclusion -- References -- Chapter 3: Humidity-Dependent Structural Phase Transitions, Layering Transitions, and Long Nucleation Times -- 3.1 AFM Snap-to-Contact Instability -- 3.2 Humidity-Dependent Structural Phase Transitions -- 3.2.1 Scanning Polarization Force Microscopy
001453562 5058_ $$a3.2.2 Humidity-Dependent Water Structure on Mica in Air -- 3.2.3 Room Temperature Ice-Like Structure on Mica -- 3.3 Pull-Off Force vs. Humidity Measurements -- 3.3.1 Pull-Off Force in an AFM Force-Displacement Curve -- 3.3.2 Pull-Off Force in the Kelvin Equation -- 3.3.3 Water Confined Between an AFM Tip and Mica -- 3.3.4 Water Confined Between an AFM Tip and a Silicon Oxide Surface -- 3.3.5 Condensation in Humidity-Dependent Phase Transitions -- 3.4 Layering Transitions of Confined Water in Air -- 3.4.1 Transverse Dynamic Force Microscopy -- 3.4.2 Tuning-Fork-Based AFM
001453562 5058_ $$a3.5 Layering Transitions in Water -- 3.5.1 Surface Force Apparatus (SFA) -- 3.5.2 ac Mode Atomic Force Microscopy (ac-AFM) -- 3.6 Long Nucleation Time of Nanoscale Water Bridges -- 3.6.1 Friction Force Measurements by AFM -- 3.6.2 Friction vs. Humidity Measurements -- 3.6.3 Friction vs. Speed Measurements -- 3.6.4 Time Responses of the Friction Force to Stepwise Changes -- 3.6.4.1 Scan Range -- 3.6.4.2 Tip Temperature -- 3.6.4.3 Tip Height -- 3.6.4.4 Holding Time -- 3.7 Viscosity of Nanoscopic Water -- 3.8 Conclusion -- References -- Chapter 4: Long-Range Condensations of Humid Air
001453562 5058_ $$a4.1 Kelvin Equation and Long-Range Condensation Distances -- 4.2 Interfacial Force Microscopy -- 4.2.1 AFM vs. IFM -- 4.2.2 Simultaneous Measurement of Normal and Friction Forces -- 4.2.3 Development of Optical Fiber Probes -- 4.2.4 Sample Preparation -- 4.2.5 Force-Distance Curve Measurements -- 4.3 Cantilever-Based Optical Interfacial Force Microscopy -- 4.3.1 IFM vs. COIFM -- 4.3.2 Design and Development of COIFM -- 4.3.3 Feedback Response Test -- 4.3.4 Euler Equations of a Cantilever Beam -- 4.3.5 Coupling of Normal and Friction Forces Through Cantilever Deflection -- 4.3.6 Force Calibration
001453562 506__ $$aAccess limited to authorized users.
001453562 520__ $$aDespite advances in the long-range electrostatic double-layer force, which depends strongly on ionic strength in water by using theoretical models such as DLVO (Derjaguin, Landau, Verwey, and Overbeek), the structure of confined water in air still remains widely unknown and has led to a variety of unexplained phenomena. This book bridges that gap by introducing a newly developed scanning probe miscroscopy (SPM) approach, which enables one to probe confined water at the molecular and atomic scale. Written by the developer of SPM, this book covers this new approach, as well as original approaches to addressing general interfacial water issues. It also introduces the cantilever-based optical interfacial force microscope (COIFM), which was invented by the author along with the methodology. The improved understanding will contribute to liquid-based nano- and bio-technologies such as lab-on-a-chip technologies, nanofluidic devices, dip-pen nanolithography, nano-oxidation, water-based granular interactions, liquid-based nanolubricants, hydration layers in biopolymers, manipulation of biomolecules, protein folding, stability of colloid suspensions, enzyme activity, swelling in clays, development of bioactive surfaces, water columns and ion channeling in membranes and scanning probe microscopy (SPM). It will also contribute to the improved performance of moving components in silicon-based micro-electro-mechanical system (MEMS) devices, where water plays a key role in interfacial interactions.
001453562 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed January 9, 2023).
001453562 650_0 $$aScanning probe microscopy.
001453562 650_0 $$aSelf-assembly (Chemistry)
001453562 650_0 $$aWater$$xSpectra.
001453562 655_0 $$aElectronic books.
001453562 77608 $$iPrint version: $$z3031190858$$z9783031190858$$w(OCoLC)1345511900
001453562 852__ $$bebk
001453562 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-19087-2$$zOnline Access$$91397441.1
001453562 909CO $$ooai:library.usi.edu:1453562$$pGLOBAL_SET
001453562 980__ $$aBIB
001453562 980__ $$aEBOOK
001453562 982__ $$aEbook
001453562 983__ $$aOnline
001453562 994__ $$a92$$bISE