TY  - GEN
N2  - Drawing upon both ethnographic research and genealogical analysis, this book represents the first in-depth scientific analysis of criminal offenders electronic monitoring (EM) in Latin Americas largest country. It focuses on three empirical axes: 1) the implementation of EM policies against the backdrop of Brazils collapsing carceral system; 2) the discourses and rationalities which undergird the deployment of EM; and 3) the effects of EM upon convicts moving back and forth between penal institutions and urban spaces governed by armed militias, criminal gangs, and abusive police forces. The book is ideal for researchers and practitioners concerned with the fields of criminal justice and public security all over the world.
DO  - 10.1007/978-3-031-21859-0
DO  - doi
AB  - Drawing upon both ethnographic research and genealogical analysis, this book represents the first in-depth scientific analysis of criminal offenders electronic monitoring (EM) in Latin Americas largest country. It focuses on three empirical axes: 1) the implementation of EM policies against the backdrop of Brazils collapsing carceral system; 2) the discourses and rationalities which undergird the deployment of EM; and 3) the effects of EM upon convicts moving back and forth between penal institutions and urban spaces governed by armed militias, criminal gangs, and abusive police forces. The book is ideal for researchers and practitioners concerned with the fields of criminal justice and public security all over the world.
T1  - Short circuit :electric monitoring and the crisis of the Brazilian prison system /
DA  - 2023.
CY  - Cham, Switzerland :
AU  - Campello, Ricardo Urquizas,
CN  - HV9332
PB  - Springer,
PP  - Cham, Switzerland :
PY  - 2023.
ID  - 1454318
KW  - Electronic monitoring of parolees and probationers
KW  - Alternatives to imprisonment
KW  - Community-based corrections
KW  - Electronic surveillance
SN  - 9783031218590
SN  - 3031218590
TI  - Short circuit :electric monitoring and the crisis of the Brazilian prison system /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-21859-0
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-21859-0
ER  -