Advancements in optical methods, digital image correlation & micro-and nanomechanics : proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics. Volume 4 / Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang, Mohammad Naraghi, Frank DelRio, editors.
Annual Conference on Experimental and Applied Mechanics (2022); Lin, Ming-Tzer, editor.; Furlong, Cosme, editor.; Hwang, Chi-Hung, editor.; Naraghi, Mohammad H., editor.; DelRio, Frank W., editor.
2022
TA1505
Available Online

Linked e-resources

Linked Resource Online Access
Concurrent users Unlimited
Authorized users Authorized users
Document Delivery Supplied Can lend chapters, not whole ebooks

Details

Title Advancements in optical methods, digital image correlation & micro-and nanomechanics : proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics. Volume 4 / Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang, Mohammad Naraghi, Frank DelRio, editors.
Meeting Name Annual Conference on Experimental and Applied Mechanics (2022)
ISBN 9783031174711 (electronic bk.)
3031174712 (electronic bk.)
9783031174704
3031174704
DOI https://doi.org/10.1007/978-3-031-17471-1
Published Cham : Springer, 2022.
Language English
Description 1 online resource (1 volume) : illustrations (black and white).
Other Standard Identifiers 10.1007/978-3-031-17471-1 doi
Call Number TA1505
Dewey Decimal Classification 621.36
Summary Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas: DIC Methods & Its Applications Photoelsticity and Interferometry Applications Micro-Optics and Microscopic Systems Multiscale and New Developments in Optical Methods Extreme Nanomechanics In-Situ Nanomechanics Expanding Boundaries in Metrology Micro and Nanoscale Deformation MEMS for Actuation, Sensing and Characterization 1D & 2D Materials.
Access Note Access limited to authorized users.
Source of Description Description based on print version record.
Added Author Lin, Ming-Tzer, editor.
Furlong, Cosme, editor.
Hwang, Chi-Hung, editor.
Naraghi, Mohammad H., editor.
DelRio, Frank W., editor.
Series Conference proceedings of the Society for Experimental Mechanics series.
Available in Other Form Advancements in optical methods, digital image correlation & micro-and nanomechanics : Volume 4.
Linked Resources Online Access
Record Appears in Online Resources > Ebooks
All Resources
Innovations in Super Resolution Microscopy
Measuring Strain Distribution Around Inclusions and Matrix Interface Using Global Digital Image Correlation
Evaluation of Stress State and Fracture Strain of High-Strength Steel Using Stereo Image Correction
Bistability and Irregular Oscillations in Pairs of Opto-thermal Micro-oscillators
Noninvasive Shape Measurements by MEMS-based Fringe Projection with Application to Middle-ear Mechanics
High-Speed Optical Extensometer for Uniaxial Kolsky Bar Experiments
On the Miura Ori Modal Response: A Look Throughout the Experimental Side
Using Digital Image Correlation to Characterize the Static and Dynamic Behavior of Structures: Industrial Applications and Lessons Learned
EnablingDigital Image Correlation withHigh-ResolutionMicroscopic OpticsviaWorking DistanceAutomation:AdvancingResolutionand Accuracy Limits
Characterization of Bioengineered Tissues by Digital Holographic Vibrometry and 3D Shape Deep Learning
Coordinated Twinning Bands in Magnesium at the Existence of Stress Raisers via in situ Microscopic Image Correlation
Determining the Onset of Transverse Cracking in a Woven Composite using Digital Image Correlation.

Browse Subjects

Show more subjects...

Statistics

from
to
Export