TY  - GEN
AB  - This book discusses practical applications of reliability and statistical methods and techniques in various disciplines, using machine learning, artificial intelligence, optimization, and other computation methods. Bringing together research from international experts, each chapter aims to cover both methods and practical aspects on reliability or statistical computations with emphasis on applications. 5G and IoT are set to generate an estimated 1 billion terabytes of data by 2025 and companies continue to search for new techniques and tools that can help them practice data collection effectively in promoting their business. This book explores the era of big data through reliability and statistical computing, showcasing how almost all applications in our daily life have experienced a dramatic shift in the past two decades to a truly global industry. Including numerous illustrations and worked examples, the book is of interest to researchers, practicing engineers, and postgraduate students in the fields of reliability engineering, statistical computing, and machine learning.
AU  - Pham, Hoang,
CN  - QA76.76.R44
DO  - 10.1007/978-3-031-21232-1
DO  - doi
ID  - 1454775
KW  - Computer systems
KW  - Reliability (Engineering)
KW  - Mathematical statistics
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-21232-1
N2  - This book discusses practical applications of reliability and statistical methods and techniques in various disciplines, using machine learning, artificial intelligence, optimization, and other computation methods. Bringing together research from international experts, each chapter aims to cover both methods and practical aspects on reliability or statistical computations with emphasis on applications. 5G and IoT are set to generate an estimated 1 billion terabytes of data by 2025 and companies continue to search for new techniques and tools that can help them practice data collection effectively in promoting their business. This book explores the era of big data through reliability and statistical computing, showcasing how almost all applications in our daily life have experienced a dramatic shift in the past two decades to a truly global industry. Including numerous illustrations and worked examples, the book is of interest to researchers, practicing engineers, and postgraduate students in the fields of reliability engineering, statistical computing, and machine learning.
SN  - 9783031212321
SN  - 3031212320
T1  - Applications in reliability and statistical computing /
TI  - Applications in reliability and statistical computing /
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-21232-1
ER  -