TY  - GEN
AU  - Yoshida, Yutaka,
AU  - Langouche, Guido,
CN  - QD181.S6
ID  - 1459693
KW  - Silicon.
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6302873
SN  - 9784431558002 (e-book)
T1  - Defects and impurities in silicon materials :an introduction to atomic-level silicon engineering /
TI  - Defects and impurities in silicon materials :an introduction to atomic-level silicon engineering /
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6302873
VL  - Volume 916
ER  -