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001459693 020__ $$z9784431557999
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001459693 24500 $$aDefects and impurities in silicon materials :$$ban introduction to atomic-level silicon engineering /$$cYutaka Yoshida, Guido Langouche, editors.
001459693 264_1 $$aTokyo :$$bSpringer,$$c[2016]
001459693 264_4 $$c2016
001459693 300__ $$a1 online resource (498 pages).
001459693 336__ $$atext$$btxt$$2rdacontent
001459693 337__ $$acomputer$$bc$$2rdamedia
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001459693 4901_ $$aLecture notes in physics ;$$vVolume 916
001459693 506__ $$aAccess limited to authorized users.
001459693 588__ $$aDescription based on print version record.
001459693 650_0 $$aSilicon.
001459693 655_0 $$aElectronic books
001459693 7001_ $$aYoshida, Yutaka,$$eeditor.
001459693 7001_ $$aLangouche, Guido,$$eeditor.
001459693 77608 $$iPrint version:$$tDefects and impurities in silicon materials : an introduction to atomic-level silicon engineering.$$dTokyo : Springer, c2016 $$z9784431557999
001459693 830_0 $$aLecture notes in physics ;$$vVolume 916.
001459693 852__ $$bebk
001459693 85640 $$3ProQuest Ebook Central Academic Complete $$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6302873$$zOnline Access
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