@article{1463213,
      author = {Nedelcu, Nicoleta,},
      url = {http://library.usi.edu/record/1463213},
      title = {Thin films : processes and characterization techniques /},
      abstract = {The book provides research scientists and engineers in  industry information and data on the materials processing,  characterization, and determination of materials  physical-chemical properties. The book highlights optical  and chemical properties obtained on novel materials using a  range of deposition methods by two different spectroscopic  techniques: SE and UV-VIS-NIR. Emphasizing applications  from across a number of domains including Healthcare,  Opto-Electronic, and Defense, the book is ideal for  academic researchers, graduate/undergraduate students, and  practicing engineers concerned with optical coating  technologies. Describes creation of new materials thermal  evaporation, sputtering, electrochemical and  chemical-vacuum deposition; Explains a technology for  material evaporation, uniformity calculation, thickness  measurement and layer characterization; Highlights the  correlation of optical and chemical properties obtained  from spectroscopic methods.},
      doi = {https://doi.org/10.1007/978-3-031-06616-0},
      recid = {1463213},
      pages = {1 online resource (1 volume) :},
}