TY  - GEN
N2  - The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
DO  - 10.1007/978-3-031-06616-0
DO  - doi
AB  - The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
T1  - Thin films :processes and characterization techniques /
AU  - Nedelcu, Nicoleta,
CN  - TA418.9.T45
ID  - 1463213
KW  - Thin films.
SN  - 9783031066160
SN  - 3031066162
TI  - Thin films :processes and characterization techniques /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-06616-0
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-06616-0
ER  -