001463213 000__ 03411cam\a2200577\i\4500
001463213 001__ 1463213
001463213 003__ OCoLC
001463213 005__ 20230601003310.0
001463213 006__ m\\\\\o\\d\\\\\\\\
001463213 007__ cr\cn\nnnunnun
001463213 008__ 230414s2023\\\\sz\a\\\\ob\\\\001\0\eng\d
001463213 019__ $$a1379588099
001463213 020__ $$a9783031066160$$qelectronic book
001463213 020__ $$a3031066162$$qelectronic book
001463213 020__ $$z9783031066153
001463213 020__ $$z3031066154
001463213 0247_ $$a10.1007/978-3-031-06616-0$$2doi
001463213 035__ $$aSP(OCoLC)1376017242
001463213 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dN$T$$dYDX
001463213 049__ $$aISEA
001463213 050_4 $$aTA418.9.T45$$bN44 2023
001463213 08204 $$a621.3815/2$$223/eng/20230414
001463213 1001_ $$aNedelcu, Nicoleta,$$eauthor.
001463213 24510 $$aThin films :$$bprocesses and characterization techniques /$$cNicoleta Nedelcu.
001463213 264_1 $$aCham, Switzerland :$$bSpringer,$$c2023.
001463213 300__ $$a1 online resource (1 volume) :$$billustrations (colour).
001463213 336__ $$atext$$btxt$$2rdacontent
001463213 337__ $$acomputer$$bc$$2rdamedia
001463213 338__ $$aonline resource$$bcr$$2rdacarrier
001463213 504__ $$aIncludes bibliographical references and index.
001463213 5050_ $$aChapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties.
001463213 506__ $$aAccess limited to authorized users.
001463213 520__ $$aThe book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
001463213 588__ $$aDescription based on online resource; title from digital title page (viewed on May 09, 2023).
001463213 650_0 $$aThin films.
001463213 655_0 $$aElectronic books.
001463213 77608 $$iPrint version:$$aNedelcu, Nicoleta.$$tThin films.$$dCham : Springer, 2022$$z9783031066153$$w(OCoLC)1328016186
001463213 852__ $$bebk
001463213 85640 $$3Springer Nature$$uhttps://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-06616-0$$zOnline Access$$91397441.1
001463213 909CO $$ooai:library.usi.edu:1463213$$pGLOBAL_SET
001463213 980__ $$aBIB
001463213 980__ $$aEBOOK
001463213 982__ $$aEbook
001463213 983__ $$aOnline
001463213 994__ $$a92$$bISE