TY  - GEN
N2  - The book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It contains original research works presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2022), held in Bheemavaram, West Godavari (Dist), Andhra Pradesh, India during 22 23 July 2022. The papers were written by scientists, research scholars and practitioners from leading universities, engineering colleges and R&D institutes from all over the world, and share the latest breakthroughs in and promising solutions to the most important issues facing todays society.
DO  - 10.1007/978-981-19-8865-3
DO  - doi
AB  - The book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It contains original research works presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2022), held in Bheemavaram, West Godavari (Dist), Andhra Pradesh, India during 22 23 July 2022. The papers were written by scientists, research scholars and practitioners from leading universities, engineering colleges and R&D institutes from all over the world, and share the latest breakthroughs in and promising solutions to the most important issues facing todays society.
T1  - Advances in signal processing, embedded systems and IoT :proceedings of seventh ICMEET-2022 /
DA  - 2023.
CY  - Singapore :
AU  - Chakravarthy, V. V. S. S. Sameer.
AU  - Bhateja, Vikrant.
AU  - Flores-Fuentes, Wendy,
AU  - Anguera, Jaume.
AU  - Vasavi, K. Padma.
VL  - v.992
CN  - TK5102.9
PB  - Springer,
PP  - Singapore :
PY  - 2023.
N1  - Includes author index.
ID  - 1468516
KW  - Signal processing
KW  - Telecommunication systems
KW  - Microelectronics
KW  - Electromagnetism
SN  - 9789811988653
SN  - 981198865X
TI  - Advances in signal processing, embedded systems and IoT :proceedings of seventh ICMEET-2022 /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-8865-3
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-981-19-8865-3
ER  -