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001469360 020__ $$a9781119910121
001469360 020__ $$a1119910129
001469360 020__ $$a9781119910114
001469360 020__ $$a1119910110
001469360 020__ $$a9781119910107
001469360 020__ $$a1119910102
001469360 020__ $$z1119910099
001469360 020__ $$z9781119910091
001469360 040__ $$aNhCcYBP$$cNhCcYBP
001469360 050_4 $$aTK7876$$b.R36 2023
001469360 08204 $$a621.3813$$223
001469360 1001_ $$aRanda, James,$$eauthor.$$1https://isni.org/isni/0000000117442794.
001469360 24510 $$aPrecision measurement of microwave thermal noise /$$cJames Randa.
001469360 264_1 $$aHoboken, New Jersey :$$bJohn Wiley & Sons, Inc.,$$c[2023]
001469360 300__ $$a1 online resource :$$billustrations (some color)
001469360 336__ $$atext$$btxt$$2rdacontent
001469360 337__ $$acomputer$$bc$$2rdamedia
001469360 338__ $$aonline resource$$bcr$$2rdacarrier
001469360 504__ $$aIncludes bibliographical references and index.
001469360 5050_ $$aCover -- Title Page -- Copyright -- Contents -- Preface -- Chapter 1 Background -- 1.1 Nyquist's Theorem and Noise Temperature -- 1.1.1 Nyquist's Theorem -- 1.1.2 Limits and Numbers -- 1.1.3 Definition of Noise Temperature -- 1.1.4 Excess Noise Ratio and T0 -- 1.2 Microwave Networks -- 1.2.1 Notation -- 1.2.2 Noise Correlation Matrix and Bosma's Theorem -- 1.2.3 Power Ratios -- 1.2.4 Noise-Temperature Translation Through a Passive Device -- References -- References -- Chapter 2 Noise-Temperature Standards -- 2.1 Introduction -- 2.2 Ambient Standards -- 2.3 Hot (Oven) Standards -- 2.4 Cryogenic Standards -- 2.4.1 Coaxial Standards -- 2.4.2 Waveguide Standards -- 2.5 Other Standards and Noise Sources -- 2.5.1 Tunable Primary Standards -- 2.5.2 "Equivalent Hot Standard" Based on RF Power -- 2.5.3 Secondary Standards -- 2.5.4 Synthetic Primary Standards -- References -- Chapter 3 Noise-Temperature Measurement -- 3.1 Background -- 3.2 Total-Power Radiometer -- 3.2.1 Idealized Case -- 3.2.2 Nonideal Case -- 3.2.3 Radiometer Equation for Isolated Total-Power Radiometer -- 3.2.4 Total-Power Radiometer Design -- 3.2.5 Radiometer Testing -- 3.3 Total-Power Radiometer Uncertainties -- 3.3.1 Type-A Uncertainties -- 3.3.2 Type-B Uncertainties -- 3.3.3 Sample Results -- 3.4 Other Radiometer Designs -- 3.4.1 Switching or Dicke Radiometer -- 3.4.2 Digital Radiometer -- 3.5 Measurements through Adapters -- 3.6 Traceability and Inter-laboratory Comparisons -- References -- Chapter 4 Amplifier Noise -- 4.1 Noise Figure, Effective Input Noise Temperature -- 4.2 Noise-Temperature Definition Revisited -- 4.3 Noise Figure Measurement, Simple Case -- 4.4 Definition of Noise Parameters -- 4.4.1 Circuit Treatment of Noisy Amplifier -- 4.4.2 Wave Representation of Noise Parameters -- 4.5 Measurement of Noise Parameters -- 4.5.1 General Measurement Setup.
001469360 5058_ $$a4.5.2 Fit to Noise-Figure Parameterization -- 4.5.3 Fit to Noise-Temperature or Power Parameterization -- 4.5.4 Possible Variations When Using the Wave Formulation -- 4.5.5 Choice of Input Terminations -- 4.5.6 Commercial Systems, Source-Pull Measurements -- 4.5.7 Frequency-Variation Method -- 4.6 Uncertainty Analysis for Noise-Parameter Measurements -- 4.6.1 Simple Considerations -- 4.6.2 Full Analysis -- 4.6.3 Input Uncertainties -- 4.6.4 General Features and Sample Results -- 4.7 Simulations and Strategies -- References -- Chapter 5 On-Wafer Noise Measurements -- 5.1 Introduction -- 5.2 On-Wafer Microwave Formalism -- 5.2.1 Traveling Waves vs. Pseudo Waves -- 5.2.2 On-Wafer Reference Planes -- 5.3 Noise-Temperature Measurements -- 5.4 On-Wafer Noise-Parameter Measurements -- 5.4.1 General -- 5.4.2 Radiometer-Based Systems -- 5.4.3 Commercial Systems and Reference-Plane Considerations -- 5.4.4 "Enhanced" or Model-Assisted Measurements -- 5.5 Uncertainties -- 5.5.1 Differences from Packaged Amplifiers -- 5.5.2 General Features and Properties -- 5.5.3 Measurement Strategies -- References -- Chapter 6 Noise-Parameter Checks and Verification -- 6.1 Measurement of Passive or Previously Measured Devices -- 6.2 Physical Bounds and Model Predictions -- 6.3 Tandem or Hybrid Measurements -- References -- Chapter 7 Cryogenic Amplifiers -- 7.1 Background -- 7.1.1 Introduction -- 7.1.2 Vacuum-Fluctuation Contribution -- 7.2 Measurement of the Matched Noise Figure -- 7.2.1 Cold-Attenuator Method -- 7.2.2 Internal Hot-Cold Method -- 7.2.3 Full-Characterization Measurements -- 7.3 Noise-Parameter Measurement -- References -- Chapter 8 Multiport Amplifiers -- 8.1 Introduction -- 8.2 Formalism and Noise Matrix -- 8.3 Definition of Noise Figure for Multiports -- 8.4 Degradation of Signal-to-Noise Ratio.
001469360 506__ $$aAccess limited to authorized users
001469360 533__ $$aElectronic reproduction.$$bAnn Arbor, MI$$nAvailable via World Wide Web.
001469360 588__ $$aDescription based on online resource; title from digital title page (viewed on December 30, 2022).
001469360 650_0 $$aMicrowave measurements.
001469360 650_0 $$aMicrowave devices$$xTesting.
001469360 655_0 $$aElectronic books
001469360 7102_ $$aProQuest (Firm)
001469360 77608 $$iPrint version:$$z1119910099$$z9781119910091
001469360 852__ $$bebk
001469360 85640 $$3GOBI DDA$$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=7130218$$zOnline Access
001469360 909CO $$ooai:library.usi.edu:1469360$$pGLOBAL_SET
001469360 980__ $$aBIB
001469360 980__ $$aEBOOK
001469360 982__ $$aEbook
001469360 983__ $$aOnline