Cover
Title Page
Copyright
Contents
Preface
Chapter 1 Background
1.1 Nyquist's Theorem and Noise Temperature
1.1.1 Nyquist's Theorem
1.1.2 Limits and Numbers
1.1.3 Definition of Noise Temperature
1.1.4 Excess Noise Ratio and T0
1.2 Microwave Networks
1.2.1 Notation
1.2.2 Noise Correlation Matrix and Bosma's Theorem
1.2.3 Power Ratios
1.2.4 Noise-Temperature Translation Through a Passive Device
References
References
Chapter 2 Noise-Temperature Standards
2.1 Introduction
2.2 Ambient Standards
2.3 Hot (Oven) Standards
2.4 Cryogenic Standards
2.4.1 Coaxial Standards
2.4.2 Waveguide Standards
2.5 Other Standards and Noise Sources
2.5.1 Tunable Primary Standards
2.5.2 "Equivalent Hot Standard" Based on RF Power
2.5.3 Secondary Standards
2.5.4 Synthetic Primary Standards
References
Chapter 3 Noise-Temperature Measurement
3.1 Background
3.2 Total-Power Radiometer
3.2.1 Idealized Case
3.2.2 Nonideal Case
3.2.3 Radiometer Equation for Isolated Total-Power Radiometer
3.2.4 Total-Power Radiometer Design
3.2.5 Radiometer Testing
3.3 Total-Power Radiometer Uncertainties
3.3.1 Type-A Uncertainties
3.3.2 Type-B Uncertainties
3.3.3 Sample Results
3.4 Other Radiometer Designs
3.4.1 Switching or Dicke Radiometer
3.4.2 Digital Radiometer
3.5 Measurements through Adapters
3.6 Traceability and Inter-laboratory Comparisons
References
Chapter 4 Amplifier Noise
4.1 Noise Figure, Effective Input Noise Temperature
4.2 Noise-Temperature Definition Revisited
4.3 Noise Figure Measurement, Simple Case
4.4 Definition of Noise Parameters
4.4.1 Circuit Treatment of Noisy Amplifier
4.4.2 Wave Representation of Noise Parameters
4.5 Measurement of Noise Parameters
4.5.1 General Measurement Setup.

4.5.2 Fit to Noise-Figure Parameterization
4.5.3 Fit to Noise-Temperature or Power Parameterization
4.5.4 Possible Variations When Using the Wave Formulation
4.5.5 Choice of Input Terminations
4.5.6 Commercial Systems, Source-Pull Measurements
4.5.7 Frequency-Variation Method
4.6 Uncertainty Analysis for Noise-Parameter Measurements
4.6.1 Simple Considerations
4.6.2 Full Analysis
4.6.3 Input Uncertainties
4.6.4 General Features and Sample Results
4.7 Simulations and Strategies
References
Chapter 5 On-Wafer Noise Measurements
5.1 Introduction
5.2 On-Wafer Microwave Formalism
5.2.1 Traveling Waves vs. Pseudo Waves
5.2.2 On-Wafer Reference Planes
5.3 Noise-Temperature Measurements
5.4 On-Wafer Noise-Parameter Measurements
5.4.1 General
5.4.2 Radiometer-Based Systems
5.4.3 Commercial Systems and Reference-Plane Considerations
5.4.4 "Enhanced" or Model-Assisted Measurements
5.5 Uncertainties
5.5.1 Differences from Packaged Amplifiers
5.5.2 General Features and Properties
5.5.3 Measurement Strategies
References
Chapter 6 Noise-Parameter Checks and Verification
6.1 Measurement of Passive or Previously Measured Devices
6.2 Physical Bounds and Model Predictions
6.3 Tandem or Hybrid Measurements
References
Chapter 7 Cryogenic Amplifiers
7.1 Background
7.1.1 Introduction
7.1.2 Vacuum-Fluctuation Contribution
7.2 Measurement of the Matched Noise Figure
7.2.1 Cold-Attenuator Method
7.2.2 Internal Hot-Cold Method
7.2.3 Full-Characterization Measurements
7.3 Noise-Parameter Measurement
References
Chapter 8 Multiport Amplifiers
8.1 Introduction
8.2 Formalism and Noise Matrix
8.3 Definition of Noise Figure for Multiports
8.4 Degradation of Signal-to-Noise Ratio.